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洋書 | 技術書

Field Guide to Interferometric Optical Testing
商品コード: 9780819465108

Field Guide to Interferometric Optical Testing

販売価格(税込) 4,830 円
ポイント: 48 Pt
個  数

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Eric P. Goodwin, James C. Wyant
114pages Spiral Bound
2008/8/6
FG10

詳細

A distillation of Dr. Wyant's course at the University of Arizona, this Field Guide covers the key fundamentals of interferometry, types of interferometers and interferograms, concepts of phase-shifting interferometry, long-wavelength interferometry, testing of aspheric surfaces, measurement of surface microstructure, flat and curved surface testing, and absolute measurements.  

Glossary
Fundamentals of Interferometry
  Two-Beam Interference Equation
  Basic Concepts and Definitions
  Conditions for Obtaining Fringes
  Visibility
  Spatial Coherence
  Polarization
  Beamsplitters
  Plate and Pellicle Beamsplitters
Interferometers
  The Interferometer
  Classic Fizeau Interferograms
  Newton?s Rings
  Twyman-Green Interferometer
  Compensating Plate
  PBS-based Twyman-Green Interferometer
  Laser-based Fizeau
  Mach-Zender Interferometer
  Beam Testing
  Lateral Shear Interferometry
  Rotating Grating LSI
  Radial Shear Interferometer
Interferograms
  Interferograms
  Wavefront Aberration Coefficients
  Zernike Polynomials
  RMS Wavefront Error
  Spherical Aberration Interferograms
  Astigmatism Interferograms
  Interferograms?Other Aberrations
  Moir?
  Moir? and Interferograms
Phase-Shifting Interferometry
  Direct Phase Measurement
  Methods for Phase Shifting
  Continuous Phase Shifting
  Liquid Crystal Retarder
  Phase Shifting Algorithms
  Basic Phase Unwrapping
  Phase Stepping vs. Phase Ramping
  Errors in PSI
  Quantization Errors
  Incorrect Phase Shift
  Avoiding Vibrations
  Spatial Synchronous and Fourier Methods
  Spatial Carrier Interferometry
  Ground Glass
Surface Microstructure
  Surface Microstructure
  Nomarski Interference Microscope
  Fringes of Equal Chromatic Order (FECO)
  Phase-Shifting Interference Microscope
  Multiple-Wavelength Interferometer
  Vertical Scanning Techniques
Flat Surface Testing
  Flat Surface Testing
  Mirrors--Continued
  Windows--Continued
  Prisms
  Corner Cubes
Curved Surface Testing
  Testing Curved Surfaces?Test Plate
  Curved Surfaces?Twyman-Green
  Curved Surfaces?Laser-based Fizeau
  Testing Lenses or Lens Systems
  Shack Cube Interferometer
  Scatterplate Interferometer
  Phase-Shifting Scatterplate Interferometer
  Long-Wavelength Interferometry
  Smartt Point Diffraction Interferometer
  Phase Shifting a PDI
  Sommargren Diffraction Interferometer
  Curved Surfaces, VSWLI
Absolute Measurements
  Absolute Measurements: Flats
  Absolute Measurements: Spheres
Asphere Testing
  Aspheric Surfaces
  Aspheric Testing
  Hyperboloid Null Tests
  Offner Null
  Holographic Null Optics
  CGH Basics
  CGH Design Guidelines
  Non-Null Tests
  Reverse Raytracing
  Sub-Nyquist Interferometry
  Long-Wavelength Interferometry
Appendices
  Non-Interferometric Testing
  Foucault (Knife-Edge) Test
  Ronchi Test
Equation Summary
Bibliography
Index

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